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General Information

Technical Information

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Past editions

23^rd European Symposium on Reliability of Electron Devices,

Failure Physics and Analysis

October 1 - 5, 2012 Cagliari, Italy

and the joint thematic day on October 3, 2012 with:

3^rd International Symposium on Reliability of

Optoelectronics for Space (ISROS 2012)

With the technical co-sponsorship of:

IEEE - Electron Devices Society
IEEE - Reliability Society

and:

ECPE - European Center for Power Electronics

Organized by:

News

14.05.2012
The registration procedure is now open.
Please, visit the registration page.

10.05.2012
The mentoring process has started. Visit Authors' corner page for a complete roadmap.

30.04.2012 The Steering committee has been joined by three other members, from industry and academia. Welcome to all of them and have a good work! Visit the Committees page.

05.04.2012
Late-news papers can be exceptionally accepted till April, 18 (hard) to include key results in the reliability knowledge. Details at the Authors' corner page.

27.03.2012
The submission procedure has been closed with a great success in terms of number of papers.

19.03.2012
Due to a large number of requests, the deadline for paper submission has been extended to March 26, 2012

Download the final call for papers at the Call for Papers page

14.03.2012
Minor: a '.docx' (MS Office 2007/10) template is available at the authors' page

15.02.2012
At the Committees page you can now find the Technical Committees chairs.

14.02.2012
At the Call for Papers page you can now find the last, up-to-date call for papers.

09.02.2012
Registration fees are available. Please, visit the registration page.

08.02.2012
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05.02.2012
The submission of 4-pages abstracts is now open.

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