Authors' Corner - Old Information
ABSTRACT FORMAT
Abstracts must be in English and be up to four pages long. The page format must be A4. The first page must clearly include the following information:
- title of the contribution
- a (maximum) five-line abstract
- complete address, fax number and e-mail address of the corresponding author
- preference for oral, poster presentation or <no preference>.
Authors are requested to upload abstracts in Adobe Acrobat PDF format. A template for summaries is available here in DOCX (zipped), DOC or PDF format.
Tip: there are many free online DOC-to-PDF converters. Search for "doc2pdf online" in common web search engines.
SUBMISSION CHECKLIST
Submission of the abstracts requires a preliminary registration to the paper service system (EasyChair) site.
Please, before proceeding to submission, keep within reach:
- the e-mail address you will use to login to EasyChair, that will be used for future references too;
- the title of the paper;
- the topic the paper belongs to (list of topics). It is also possible let the TPC choose the more close topic;
- the preference for Oral, Poster or <no preference> presentation;
- a list of at least three keywords;
- the list of the Authors and their Affiliations, complete addresses, phone and fax numbers, and e-mail addresses;
- the choice of the corresponding author;
- the text form of the abstract of the submitted work;
- the PDF file.
SUBMISSION OF ABSTRACTS
The EasyChair paper service system site is now open for submissions.
To submit a paper, access EasyChair.
IMPORTANT NOTICES:
- if you already used EasyChair in the past, you should use the same account. A password retrieval utility is available at the EasyChair login page.
- In the EasyChair system, topics are called 'tracks'.
- some old and/or non-fully html-compliant browsers may cause troubles in the paper submission procedure. Microsoft Internet Explorer 7 or higher, Mozilla Firefox 3.6 and Opera 10.50 are fully compliant with that standard.
TOPIC LIST
Topic | |
A | Quality and Reliability Techniques for Devices and Systems |
B1 | Characterisation and Modelling of Failure Mechanisms in Silicon technologies and Nanoelectronics: Hot carriers, high K, gate materials,… |
B2 | Characterisation and Modelling of Failure Mechanisms in Silicon technologies and Nanoelectronics: low K, Cu Interconnects, … |
B3 | Characterisation and Modelling of Failure Mechanisms in Silicon technologies and Nanoelectronics: ESD and Latch-up |
C1 | Advanced Techniques for failure analysis and Case studies: Electron and Optical Beam Testing |
C2 | Advanced Techniques for failure analysis and Case studies: Other advanced characterisation techniques |
D | Failure Mechanisms in Microwave, wide Band-Gap and Photonic Devices |
E | Packaging, Assemblies, Passive Components and MEMS |
F | Power, Automotive, Aerospace and Industrial Applications |
G | Reliability of Photovoltaic and Organic devices: Thin Film, concentration, OLED, TFT, … |